- 1st generation
- reflected-light mode
- fine optical sectioning
- nanometer accuracy in vertical direction
- real-time (12 fps) & time-lapse imaging
- motorized XYZ piezo stage
- halogen lamp illumination
- surface profilometry
- quantitative phase imaging
- imaging through scattering media
- 2nd generation
- transmitted-light mode
- inverted or upright configuration possible
- nanometer accuracy in vertical direction
- real-time (12 fps) & time-lapse imaging
- halogen lamp illumination
- temperature stabilized stage and box
- flow chambers
- quantitative phase imaging
- imaging through scattering media
- reflected-light mode
- brightfield, darkfield
- differential interference contrast (Nomarski DIC)
- qualitative polarizing observations
- epi-fluorescence
- 100W halogen lamp, 75W xenon lamp
- Y-IDP double port
- reflected-light confocal microscope
- real-time optical sectioning
- mercury arc-lamp illumination
- motorized XYZ piezo stage
- transmited-light mode
- brightfield, darkfield
- phase contrast
- transmitted-light mode
- inverted configuration
- phase contrast
Čeština
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