• 1st generation
  • reflected-light mode
  • fine optical sectioning
  • nanometer accuracy in vertical direction
  • real-time (12 fps) & time-lapse imaging
  • motorized XYZ piezo stage
  • halogen lamp illumination
  • surface profilometry
  • quantitative phase imaging
  • imaging through scattering media
  • 2nd generation
  • transmitted-light mode
  • inverted or upright configuration possible
  • nanometer accuracy in vertical direction
  • real-time (12 fps) & time-lapse imaging
  • halogen lamp illumination
  • temperature stabilized stage and box
  • flow chambers
  • quantitative phase imaging
  • imaging through scattering media
  • reflected-light mode
  • brightfield, darkfield
  • differential interference contrast (Nomarski DIC)
  • qualitative polarizing observations
  • epi-fluorescence
  • 100W halogen lamp, 75W xenon lamp
  • Y-IDP double port
  • reflected-light confocal microscope
  • real-time optical sectioning
  • mercury arc-lamp illumination
  • motorized XYZ piezo stage
  • transmited-light mode
  • brightfield, darkfield
  • phase contrast
  • transmitted-light mode
  • inverted configuration
  • phase contrast
  • transmitted-light mode